Data on oxide thickness of semiconductors are as follows: 426, 433, 415, 420, 420, 438, 417, 410, 430, 434, 423, 426, 412, 434, 435, 432, 409, 426, 409, 436, 422, 430, 411, 415.

(a) Calculate a point estimate of the mean oxide thickness for all wafers in the population. (Round your answer to three decimal places.)

(b) Calculate a point estimate of the standard deviation of oxide thickness for all wafers in the population. (Round your answer to two decimal places.)

(c) Calculate the standard error of the point estimate from part (a). (Round your answer to two decimal places.)

(d) Calculate a point estimate of the median oxide thickness for all wafers in the population. (Express your answer to one decimal places.)

(e) Calculate a point estimate of the proportion of wafers in the population that have oxide thickness greater than 430 angstrom. (Round your answer to four decimal places.)