When a chip fabrication facility is operating normally, the lifetime of a microchip operated at temperature measured in degrees celsius, is given by an exponential random variable with expected value =1/=(400/ years. occasionally, the chip fabrication plant has contamination problems and the chips tend to fail much more rapidly. to test for contamination problems, each day chips are subjected to a one-day test at =100∘c. based on the number of chips that fail in one day, design a significance test for the null hypothesis : the plant is operating normally. (a) suppose the rejection set of the test is ={> 0}. find the significance level of the test as a function of the number of chips tested.