Develop a VBE program to test the A/D, D/A, and digital I/O functions on a data acquisition card. For testing the A/D and D/A, the program should allow the user to specify which channel to test. In addition, the program should provide three testing modes: single reading from or writing to a particular channel, repeated testing of a particular channel (for reading only), and continuous testing of a combination of an A/D and D/A channels (for example reading a sine wave through the A/D and sending it back through the D/A). In the second testing mode, the program should allow the user to specify the number of times the individual reading need to be taken, and should display the average reading and the range of the readings taken during the test. For testing the digital I/O port, the program should be able to send a value (0 or 1) to any one of the 8 bits on the digital output port without affecting the current values on the other remaining 7 bits. For testing the digital input port, the program should be able to read the input value on any one of 8 bits. (Note: This problem assumes the availability of a data-acquisition card with a software library for accessing the A/D, the D/A, and the parallel port.)